MIT.nano has introduced a new X-ray diffraction (XRD) instrument, the Bruker D8 Discover Plus, to its suite of tools designed for nanoscale material analysis. This advanced system enhances the capabilities available at the Characterization.nano X-ray diffraction and imaging shared experimental facility (SEF), where researchers can examine materials’ surfaces, layers, and internal structures without causing damage. The facility supports a wide range of applications, including electronics, energy storage, healthcare, and nanotechnology, by providing detailed 3D images that map the composition and organization of materials.
The Bruker D8 Discover Plus stands out due to its high-brilliance micro-focus copper X-ray source, which is ideal for measuring small areas of thin-film samples with a large area detector. This makes it a significant addition to MIT.nano’s existing XRD systems, bringing enhanced diffraction capabilities that range from routine phase identification to complex analyses of thin film microstructures and high-temperature studies.
X-ray diffraction works by analyzing the interference patterns produced when X-rays interact with atomic planes in a material. These patterns reveal valuable information about a material’s crystalline structure, including phase, grain size, orientation, defects, and other properties. This technique is crucial across various fields; for instance, civil engineers use it to study concrete mixtures, materials scientists explore new microstructures, and electrical engineers examine crystalline thin film deposition essential for semiconductor production.
The new diffractometer supports these diverse applications and more, as explained by Fred Tutt, a PhD student in MIT’s Department of Materials Science and Engineering. Tutt notes that the addition of this high-resolution XRD system will facilitate access and enable atypical measurements that current tools do not readily allow.
The Bruker D8 Discover Plus replaces two older systems and introduces several significant upgrades. Its high-brilliance microfocus copper X-ray source produces intense X-rays from a small spot size, ranging from 2mm down to 200 microns, offering the flexibility to analyze distinct regions of a sample with high flux and spatial resolution. Furthermore, in-plane XRD allows for surface diffraction studies of thin films with non-uniform grain orientations, complementing many projects initiated in the fab. Researchers can measure the top 100 nanometers of surfaces after depositing thin film coatings in MIT.nano’s cleanroom.
Beyond collecting diffraction patterns, the new system includes advanced software for data analysis. MIT.nano research specialists are training users to operate the diffractometer and interpret the structural data it provides, further enhancing the research capabilities at Characterization.nano. For more details on this and other tools, interested individuals can visit the Characterization.nano website.
Source: MIT News
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https://news.mit.edu/2026/exploring-materials-atomic-scale-0220
